Effect Of Tetramethylammonium Hydroxide (TMAH) Etchant On The Formation Of Silicon Nanowires Transistor Patterned By Atomic Force Microscopy (AFM) Lithography
In this research, AFM lithography was performed to create nanoscale oxide pattern of silicon nanowires transistor (SiNWT) structure via local anodic oxidation (LAO) process on silicon on insulator (SOI) surface. These nanoscale oxide patterns will act as a mask to protect silicon layer during etchin...
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格式: | Thesis |
語言: | English |
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2011
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在線閱讀: | http://eprints.usm.my/43362/1/LEW%20KAM%20CHUNG.pdf http://eprints.usm.my/43362/ |
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