Effect Of Tetramethylammonium Hydroxide (TMAH) Etchant On The Formation Of Silicon Nanowires Transistor Patterned By Atomic Force Microscopy (AFM) Lithography

In this research, AFM lithography was performed to create nanoscale oxide pattern of silicon nanowires transistor (SiNWT) structure via local anodic oxidation (LAO) process on silicon on insulator (SOI) surface. These nanoscale oxide patterns will act as a mask to protect silicon layer during etchin...

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主要作者: Lew, Kam Chung
格式: Thesis
語言:English
出版: 2011
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在線閱讀:http://eprints.usm.my/43362/1/LEW%20KAM%20CHUNG.pdf
http://eprints.usm.my/43362/
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