Fabrication of Porous GaN using Bottom-Up Approached through Electron Beam Evaporator for High Efficient Devices
In recent years, the use of porous semiconductor has become an alternative way in reducing the impact of lattice mismatch and propagation of threading dislocations into the overgrown layer. Porous GaN materials have been considered as one of the most promising materials for optoelectronic applica...
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主要な著者: | , , |
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フォーマット: | Conference or Workshop Item |
言語: | English |
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2015
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オンライン・アクセス: | http://eprints.usm.my/48738/1/Section%20C%20159.pdf%20cut.pdf http://eprints.usm.my/48738/ |
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